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Online Version of Record before inclusion in an issue
Open Access

ORIGINAL RESEARCH

A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty
Qunfang Wu, Boyuan Xu, Lan Xiao, Qin Wang

Version of Record online: 20 November 2023

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This article proposes an RUL prediction method based on non-linear Wiener process considering the uncertainty of failure threshold, which can predict the joint PDF of remaining useful life (RUL) and failure threshold of the interested device in service in real-time. And the proposed method is applied to a practical case of SiC MOSFET to demonstrate its effectiveness and superiority.

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